• DocumentCode
    1840088
  • Title

    Improving of STS algorithm to detecting voltage unbalance in low voltage distribution networks

  • Author

    Gholizad, Babak

  • Author_Institution
    Niroo-Syst. Shomale-Gharb Eng. Co., Naghadeh, Iran
  • fYear
    2010
  • fDate
    7-10 Nov. 2010
  • Firstpage
    3012
  • Lastpage
    3017
  • Abstract
    Thyristor-based static transfer switches (STS´s) are feeding sensitive loads with two independent sources by monitoring voltage quality. STS is used in distribution networks to provide connection to alternate sources of ac power for critical loads when the main source fails. In distribution system sensitive loads are endangered by either voltage sag or voltage unbalance. Simulation results show that, the STS-2 of the IEEE benchmark in voltage sag and transient conditions operates properly; but do not detect voltage un-balance. In this paper, operating of the STS-2 under unbalance distribution network - as a scenario to improve the power quality for a three-phase critical load in industrial areas - is discussed. This paper presents an improved algorithm to detecting voltage unbalance with the STS-2 based on the ratio of the negative and the positive sequences. Simulation is presented in the well known software ATP/EMTP. Also load and network parameters are based on the industrial network of the Naghadeh - Iran.
  • Keywords
    distribution networks; fault diagnosis; power supply quality; IEEE benchmark; STS-2; industrial network; load parameters; low voltage distribution networks; network parameters; software ATP-EMTP; three-phase critical load; thyristor-based static transfer switches algorithm; voltage quality monitoring; voltage sag; voltage unbalance detection; Control Algorithm; Power Quality; Static Transfer Switch; Voltage Sag; Voltage Unbalance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Glendale, AZ
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-5225-5
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2010.5674951
  • Filename
    5674951