Title :
Progress towards a joint ESDA/JEDEC CDM standard: Methods, experiments, and results
Author :
Righter, Alan ; Welsher, Terry ; Farris, Marti ; Johnson, Marty ; Ward, Scott ; Dekker, Marcel ; Maloney, Tim ; Ashton, Robert ; Henry, Leo G. ; Meuse, Tom ; Barth, Jon ; Grund, Evan ; Smedes, Theo ; Ngan, Paul
Author_Institution :
Analog Devices, Wilmington, MA, USA
Abstract :
Progress toward a joint ESDA/JEDEC CDM standard is described. A “10 ohm CDM” test head experiment comparison to JEDEC standard testing is discussed. A second experiment (field plate dielectric thickness variation / ESDA test head) is described. Oscilloscope bandwidth / filtering, test head response, attenuators, and module effects are discussed.
Keywords :
attenuators; electron device testing; electrostatic discharge; oscilloscopes; test equipment; ESDA test head; JEDEC standard testing; attenuator; charged device model; electrostatic discharge; field plate dielectric thickness variation; joint ESDA-JEDEC CDM standard; oscilloscope bandwidth; test head response; Bandwidth; Current measurement; Discharges (electric); Hardware; Oscilloscopes; Probes; Standards;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
