• DocumentCode
    1840282
  • Title

    A locally matching technique for broadband flip-chip transition design

  • Author

    Chun-Long Wang ; Ruey-Beei Wu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    3
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    1397
  • Abstract
    A locally matching technique is proposed in this paper to improve the wideband performance of a flip-chip transition. The gap width of the CPW line in the flip-chip bump pad region is enlarged for achieving larger inductance to compensate for the capacitance at the transition, making the approximate impedance close to 50 /spl Omega/. An equivalent circuit is derived from the frequency response of the transition simulated by Sonnet and is used to control the resonance frequency of the structure. With a properly chosen value of the enlarged width, the resonant dip can be controlled to improve return loss over a band from DC to 60 GHz. Measurement data of the scaled structure is in good agreement with the simulation results, which validates the proposed design idea.
  • Keywords
    capacitance; compensation; coplanar waveguides; equivalent circuits; flip-chip devices; frequency response; hybrid integrated circuits; inductance; integrated circuit interconnections; microwave integrated circuits; millimetre wave integrated circuits; multichip modules; resonance; 0 to 60 GHz; CPW line; MCM; MIC; MM-wave ICs; Sonnet; broadband flip-chip transition design; capacitance compensation; equivalent circuit; flip-chip bump pad region; frequency response; gap width enlargement; inductance; locally matching technique; resonance frequency control; resonant dip control; return loss improvement; wideband performance; Capacitance; Circuit simulation; Coplanar waveguides; Equivalent circuits; Frequency response; Impedance; Inductance; Resonance; Resonant frequency; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1012116
  • Filename
    1012116