• DocumentCode
    1840407
  • Title

    Response of canonical ports to a high power electromagnetic excitation

  • Author

    Mora, N. ; Vega, F. ; Rachidi, F. ; Nyffeler, M.

  • Author_Institution
    EMC Lab., Swiss Fed. Inst. of Technol.-EPFL, Lausanne, Switzerland
  • fYear
    2011
  • fDate
    12-16 Sept. 2011
  • Firstpage
    973
  • Lastpage
    976
  • Abstract
    In this work, we present a methodology to calculate the required electromagnetic environment to achieve the maximization of the thermal response of a canonical port of interest (mainly electronic components) in order to achieve permanent damage. The |E2| τ product (E being the amplitude of the impinging electric field and τ the duration of the illumination) is shown to be the key parameter to define the required electromagnetic environment that could lead to the thermal destruction. Application examples with canonical incident waveforms are presented and discussed.
  • Keywords
    electromagnetic wave propagation; optimisation; canonical incident waveforms; canonical ports; electronic components; high power electromagnetic excitation; thermal destruction; thermal response maximization; Electric fields; Electromagnetic compatibility; Electronic components; Impedance; Transfer functions; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetics in Advanced Applications (ICEAA), 2011 International Conference on
  • Conference_Location
    Torino
  • Print_ISBN
    978-1-61284-976-8
  • Type

    conf

  • DOI
    10.1109/ICEAA.2011.6046473
  • Filename
    6046473