DocumentCode
1840407
Title
Response of canonical ports to a high power electromagnetic excitation
Author
Mora, N. ; Vega, F. ; Rachidi, F. ; Nyffeler, M.
Author_Institution
EMC Lab., Swiss Fed. Inst. of Technol.-EPFL, Lausanne, Switzerland
fYear
2011
fDate
12-16 Sept. 2011
Firstpage
973
Lastpage
976
Abstract
In this work, we present a methodology to calculate the required electromagnetic environment to achieve the maximization of the thermal response of a canonical port of interest (mainly electronic components) in order to achieve permanent damage. The |E2| τ product (E being the amplitude of the impinging electric field and τ the duration of the illumination) is shown to be the key parameter to define the required electromagnetic environment that could lead to the thermal destruction. Application examples with canonical incident waveforms are presented and discussed.
Keywords
electromagnetic wave propagation; optimisation; canonical incident waveforms; canonical ports; electronic components; high power electromagnetic excitation; thermal destruction; thermal response maximization; Electric fields; Electromagnetic compatibility; Electronic components; Impedance; Transfer functions; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetics in Advanced Applications (ICEAA), 2011 International Conference on
Conference_Location
Torino
Print_ISBN
978-1-61284-976-8
Type
conf
DOI
10.1109/ICEAA.2011.6046473
Filename
6046473
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