• DocumentCode
    1840506
  • Title

    Cycle time advantages of mini batch manufacturing and integrated metrology in a 300 mm vertical furnace

  • Author

    Noben, Renzo ; Van Driel, Rien ; Claasen-Vujcic, Tanja

  • Author_Institution
    ASM Int. NV, Bilthoven, Netherlands
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    411
  • Lastpage
    414
  • Abstract
    In order to improve cycle time in the furnace area, two alternatives are evaluated. Mini batch manufacturing and integrated metrology can both save valuable time. Dynamic simulations are used to investigate the influence of both options. The results are a cycle time improvement when going front large batch to mini batch manufacturing. The gain is up to 40% for normal lots and up to 30% for hot lots wafers. The consequence is an increase in the number of required tubes. Cycle time improvement versus costs is analysed. The cost of one hour cycle time gain is determined. Integrated metrology can save approximately 5-10% on the average cycle time
  • Keywords
    batch processing (industrial); furnaces; integrated circuit manufacture; 300 mm; cycle time; dynamic simulation; integrated metrology; mini batch manufacturing; semiconductor wafer fabrication; vertical furnace; Analytical models; Batch production systems; Boats; Costs; Europe; Fabrication; Furnaces; Inductors; Metrology; Silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Symposium, 2001 IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-6731-6
  • Type

    conf

  • DOI
    10.1109/ISSM.2001.963003
  • Filename
    963003