Title :
Theoretical and experimental approach for model extraction of multiconductor interconnects with multiple meshed planes on an APCB
Author :
Li, Y.L. ; Figueroa, David G. ; Zhong, Sherry ; Nguyen, Linda M. ; Nguyen, Tuanh ; Polka, Lesley A. ; Liao, J.C.
Author_Institution :
Intel Corp., Chandler, AZ, USA
Abstract :
Multiple meshed power and ground planes are quite common in today´s advanced PCB´s (APCB´s). The presence of meshed planes complicates the electrical modeling of interconnects in close proximity to these planes. In order to accurately model multiconductor interconnects near meshed planes, a set of test coupons was characterized. The multiconductor interconnects were modeled as cascaded lossy transmission lines. The interconnect models were validated by performing time- and frequency-domain simulations to match TDR and S-parameter measurements. The validation results from both the time and frequency domains show good agreement between the measured and simulated data. Using the interconnect model developed from the characterization results of the first set of test coupons, crosstalk models were built for multiconductor interconnects with meshed planes. To validate the crosstalk models, a second set of test coupons was analyzed. The crosstalk at both ends of each structure was measured. The measured results were compared with results from simulations. Reasonable agreement was seen between measured and simulated results and the discrepancy is being investigated further
Keywords :
S-parameters; crosstalk; frequency-domain analysis; interconnections; multiconductor transmission lines; printed circuits; time-domain analysis; time-domain reflectometry; APCB; S-parameter measurement; TDR measurement; cascaded lossy transmission line; crosstalk; electrical model; frequency-domain simulation; multiconductor interconnect; multiple meshed planes; test coupon; time-domain simulation; Crosstalk; Frequency measurement; Multiconductor transmission lines; Performance evaluation; Power transmission lines; Propagation losses; Scattering parameters; Testing; Transmission line measurements; Transmission line theory;
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4526-6
DOI :
10.1109/ECTC.1998.678845