Title :
Transient latch-up of switching arrays in power management circuits
Author :
Peachey, Nathaniel ; Gauthier, Robert ; Phelps, Rick ; Gebreselasie, Ephrem
Author_Institution :
RFMD Inc., Greensboro, NC, USA
Abstract :
Power management for handheld devices often employ dc-dc converters which use large switching arrays to supply stable voltages. Switching of the output driver arrays produce significant over-voltage and under-voltage transients. In converter circuit these transients can cause transient latch-up failures of the NFET array during normal operation. In this report the mechanisms of these transient-induced failures are investigated.
Keywords :
DC-DC power convertors; driver circuits; failure analysis; field effect transistors; power supply circuits; semiconductor device reliability; switching convertors; transient analysis; DC-DC converters; NFET array; converter circuit; handheld devices; output driver array switching; overvoltage transients; power management circuits; transient latch-up failure; transient-induced failure mechanisms; undervoltage transients; Logic gates; MOS devices; Substrates; Switches; Transient analysis; Transistors; Voltage measurement;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
