Title :
[Copyright notice]
Abstract :
The following topics are dealt with: advanced CMOS on-chip protection; system level testing; ESD electronic design automation; process simulation; failure analysis methods; EMC physics-based ESD analysis; RF on-chip protection; high voltage on-chip protection; and system level ESD analysis.
Keywords :
CMOS integrated circuits; circuit simulation; electromagnetic compatibility; electronic design automation; electrostatic discharge; failure analysis; integrated circuit testing; radiofrequency integrated circuits; system-on-chip; EMC; ESD electronic design automation; RF on-chip protection; advanced CMOS on-chip protection; failure analysis methods; high voltage on-chip protection; physics-based ESD analysis; process simulation; system level ESD analysis; system level testing;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
