DocumentCode :
1840721
Title :
Poor grounding — Major contributor to EOS
Author :
Yan, K.P. ; Gaertner, Reinhold ; Wong, C.Y.
Author_Institution :
Infineon Technol. (Malaysia) Sdn. Bhd., Free Trade Zone Batu Berendam, Batu Berendam, Malaysia
fYear :
2012
fDate :
9-14 Sept. 2012
Firstpage :
1
Lastpage :
6
Abstract :
Electrical Overstress (EOS) is one of the major complaints from customers in the semiconductor industry. This paper will focus on the area of EOS which is power induced. Some real life examples of cases will be discussed. Practical approaches to identify the root cause in a large manufacturing environment are demonstrated. Long term preventive measures to avoid re-occurrence are proposed.
Keywords :
earthing; electrostatic discharge; semiconductor industry; EOS; electrical overstress; electrostatic discharge; grounding; semiconductor industry; Earth Observing System; Electrical resistance measurement; Electrostatic discharges; Grounding; Magnetic heads; Soldering; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
ISSN :
0739-5159
Print_ISBN :
978-1-4673-1467-1
Type :
conf
Filename :
6333307
Link To Document :
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