DocumentCode
1840745
Title
Comparison of the shear strength and reliability between gold-plated and bare copper lands of a BGA package
Author
Lee, C.H. ; Lee, S.G. ; Moon, B.H.
Author_Institution
R&D Center, Anam Semicond. Inc., Seoul, South Korea
fYear
1998
fDate
25-28 May 1998
Firstpage
1103
Lastpage
1108
Abstract
In this study, we focus on the possibility that the land of bare copper in plastic ball grid array (PBGA hereafter) packages may be used instead of the gold-plated land. Comparison of the shear strength of the balls on the two types of the land is made every 100 cycles of the temperature cycling test. The result shows that the shear strength of bare copper lands with oxidization during the standard process of PBGA is almost as comparable as that of gold-plated lands within experimental error range. Surface analysis of the lands before ball attachment and after ball detachment is presented. A possible process development using copper wire is suggested
Keywords
ball grid arrays; copper; gold; oxidation; plastic packaging; reliability; shear strength; Cu; Cu-Au; bare copper land; gold-plated copper land; oxidization; plastic ball grid array package; reliability; shear strength; surface analysis; temperature cycling; Bonding; Copper; Gold; Lead; Plastic packaging; Semiconductor device packaging; Soldering; Temperature; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location
Seattle, WA
ISSN
0569-5503
Print_ISBN
0-7803-4526-6
Type
conf
DOI
10.1109/ECTC.1998.678852
Filename
678852
Link To Document