• DocumentCode
    1840745
  • Title

    Comparison of the shear strength and reliability between gold-plated and bare copper lands of a BGA package

  • Author

    Lee, C.H. ; Lee, S.G. ; Moon, B.H.

  • Author_Institution
    R&D Center, Anam Semicond. Inc., Seoul, South Korea
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    1103
  • Lastpage
    1108
  • Abstract
    In this study, we focus on the possibility that the land of bare copper in plastic ball grid array (PBGA hereafter) packages may be used instead of the gold-plated land. Comparison of the shear strength of the balls on the two types of the land is made every 100 cycles of the temperature cycling test. The result shows that the shear strength of bare copper lands with oxidization during the standard process of PBGA is almost as comparable as that of gold-plated lands within experimental error range. Surface analysis of the lands before ball attachment and after ball detachment is presented. A possible process development using copper wire is suggested
  • Keywords
    ball grid arrays; copper; gold; oxidation; plastic packaging; reliability; shear strength; Cu; Cu-Au; bare copper land; gold-plated copper land; oxidization; plastic ball grid array package; reliability; shear strength; surface analysis; temperature cycling; Bonding; Copper; Gold; Lead; Plastic packaging; Semiconductor device packaging; Soldering; Temperature; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678852
  • Filename
    678852