Title :
Sampling pin approaches for ESD test applications
Author :
Duvvury, Charvaka ; Dobson, Joel ; Gauthier, Robert ; Grund, Evan ; Carn, Brett ; Stadler, Wolfgang ; Miller, James ; Welsher, Terry ; Gaertner, Reinhold ; Ward, Scott ; Chaine, Mike ; Righter, Alan
Author_Institution :
Texas Instrum., Dallas, TX, USA
Abstract :
The concept of selecting a reduced sample of identical pins for reducing the HBM ESD test times is introduced. It is shown that when the reduced sample has a tight failure distribution above an HBM specification level, the sampling approach can be accurate and will save HBM ESD test time.
Keywords :
electrostatic discharge; failure analysis; sampling methods; ESD test applications; HBM ESD test times; HBM specification level; failure distribution; human body model; sampling pin approaches; Electrostatic discharges; Pins; Sampling methods; Stress; Stress measurement; Testing; Voltage measurement;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
