Title :
System failures due to an induced ESD within the system
Author :
Isofuku, Satoshi ; Honda, Masamitsu
Author_Institution :
Tokyo Electron. Trading Co., Ltd., Tachikawa, Japan
Abstract :
This paper reports the experimental analysis of charge induction phenomena on floating metals in an electronic system caused by walking charged human an EMI (Electromagnetic interference) on electronic circuit including system failure analysis due to a small gap discharge which is called “induced ESD”.
Keywords :
electromagnetic induction; electromagnetic interference; electrostatic discharge; failure analysis; EMI; charge induction phenomena; electromagnetic interference; electronic circuit; electronic system; failure analysis; floating metals; induced ESD; small gap discharge; system failures; walking charged human; Cable shielding; Copper; Discharges (electric); Electrostatic discharges; Impedance; Noise;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-1467-1
