DocumentCode
184086
Title
Exploiting additional actuators and sensors for nano-positioning robust motion control
Author
van Herpen, Robbert ; Oomen, Tom ; Kikken, Edward ; van de Wal, Marc ; Aangenent, Wouter ; Steinbuch, Maarten
Author_Institution
Dept. of Mech. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear
2014
fDate
4-6 June 2014
Firstpage
984
Lastpage
990
Abstract
The ongoing need for miniaturization and an increase of throughput in IC-manufacturing is obstructed by performance limitations in motion control of nano-positioning wafer stages. These limitations are imposed by flexible dynamical behavior, associated with structural deformations of the nano-positioning stages. The aim of this research is to investigate limits on achievable performance in a conventional control configuration and to mitigate these limits through the use of additional actuators and sensors. To this end, a systematic framework for control design using additional actuators and sensors in the generalized plant configuration is presented, which leads to a well-posed ℋ∞-control optimization problem that extends conventional design approaches in a natural way and exploits physical insight to address structural deformations in weighting filter design. Through an experimental confrontation of the design framework with a prototype next-generation nano-positioning motion system, successful performance enhancement beyond the conventional limits is demonstrated.
Keywords
H∞ control; actuators; control system synthesis; integrated circuit manufacture; motion control; semiconductor technology; sensors; H∞-control optimization problem; IC-manufacturing; actuators; control configuration; control design; generalized plant configuration; integrated circuit manufacturing; nanopositioning robust motion control; nanopositioning wafer stages; sensors; structural deformation; weighting filter design; Actuators; Bandwidth; Control design; Robust control; Robustness; Sensors; Standards; Identification; Mechatronics; Robust control;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2014
Conference_Location
Portland, OR
ISSN
0743-1619
Print_ISBN
978-1-4799-3272-6
Type
conf
DOI
10.1109/ACC.2014.6858927
Filename
6858927
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