• DocumentCode
    184086
  • Title

    Exploiting additional actuators and sensors for nano-positioning robust motion control

  • Author

    van Herpen, Robbert ; Oomen, Tom ; Kikken, Edward ; van de Wal, Marc ; Aangenent, Wouter ; Steinbuch, Maarten

  • Author_Institution
    Dept. of Mech. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
  • fYear
    2014
  • fDate
    4-6 June 2014
  • Firstpage
    984
  • Lastpage
    990
  • Abstract
    The ongoing need for miniaturization and an increase of throughput in IC-manufacturing is obstructed by performance limitations in motion control of nano-positioning wafer stages. These limitations are imposed by flexible dynamical behavior, associated with structural deformations of the nano-positioning stages. The aim of this research is to investigate limits on achievable performance in a conventional control configuration and to mitigate these limits through the use of additional actuators and sensors. To this end, a systematic framework for control design using additional actuators and sensors in the generalized plant configuration is presented, which leads to a well-posed ℋ-control optimization problem that extends conventional design approaches in a natural way and exploits physical insight to address structural deformations in weighting filter design. Through an experimental confrontation of the design framework with a prototype next-generation nano-positioning motion system, successful performance enhancement beyond the conventional limits is demonstrated.
  • Keywords
    H control; actuators; control system synthesis; integrated circuit manufacture; motion control; semiconductor technology; sensors; H-control optimization problem; IC-manufacturing; actuators; control configuration; control design; generalized plant configuration; integrated circuit manufacturing; nanopositioning robust motion control; nanopositioning wafer stages; sensors; structural deformation; weighting filter design; Actuators; Bandwidth; Control design; Robust control; Robustness; Sensors; Standards; Identification; Mechatronics; Robust control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2014
  • Conference_Location
    Portland, OR
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4799-3272-6
  • Type

    conf

  • DOI
    10.1109/ACC.2014.6858927
  • Filename
    6858927