• DocumentCode
    1840881
  • Title

    High-sensitive organic contaminants detecting method based on cold-trap and multiple-internal-reflection FTIR [clean room air monitoring systems]

  • Author

    Maruo, Kazuyuki ; Maeda, Yasuhiro ; Niwano, Michio

  • Author_Institution
    ADVANTEST Labs. Ltd, Sendai, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    469
  • Lastpage
    472
  • Abstract
    This paper presents a high-sensitivity organic contaminants detection method for clean room air. Using a Fourier Transform Infra-Red spectroscopy (FTIR), we can detect various chemical compounds including organic contaminants in a few minutes. In addition, by combining two efficient methods: Multiple Internal Reflection (MIR) and Cold Trap (CT), the sensitivity rate of detection chemical compounds rises drastically. By conducting experiments, it has been demonstrated that this sensitivity rate reaches to the order of ppb. This method will be used as an integral part of clean room air monitoring systems
  • Keywords
    Fourier transform spectroscopy; ULSI; air; clean rooms; condition monitoring; impurities; infrared spectroscopy; integrated circuit manufacture; organic compounds; FTIR; Fourier transform IR spectroscopy; ULSI manufacturing; chemical compounds; clean room air monitoring systems; cold trap; high-sensitivity detection method; multiple internal reflection; organic contaminants; semiconductor manfacture; semiconductor wafer processing; Chemical compounds; Fourier transforms; Infrared detectors; Infrared spectra; Optical reflection; Organic compounds; Spectroscopy; Substrates; Surface cleaning; Surface contamination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Symposium, 2001 IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-6731-6
  • Type

    conf

  • DOI
    10.1109/ISSM.2001.963017
  • Filename
    963017