DocumentCode
1840919
Title
A New Measurement Method for Determination of Transistor Parameters
Author
Chenakin, Alexunder V.
Author_Institution
Kiev Polytechnic Institute, Kiev, Ukraine
Volume
27
fYear
1995
fDate
34820
Firstpage
12
Lastpage
18
Abstract
A new measurement method for determination of transistor parameters on millimeter waves is proposed. Technique for calculation and design of the special measurement section was developed.
Keywords
Chebyshev approximation; Electromagnetic waveguides; Impedance measurement; Measurement standards; Millimeter wave measurements; Millimeter wave technology; Millimeter wave transistors; Rectangular waveguides; Transmission line measurements; Transmission line theory;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 45th
Conference_Location
Orlando, FL, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1995.327100
Filename
4119777
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