• DocumentCode
    1840946
  • Title

    PD-related stresses in the bulk dielectric for ellipsoidal voids

  • Author

    Pedersen, A. ; Crichton, G.C. ; McAllister, I.W.

  • Author_Institution
    Dept. of Phys., Tech. Univ. Denmark, Lyngby, Denmark
  • fYear
    1994
  • fDate
    23-26 Oct 1994
  • Firstpage
    79
  • Lastpage
    84
  • Abstract
    In a previous study, the existence of a field enhancement in the solid dielectric in the vicinity of void undergoing PD activity was established. That study was undertaken with reference to a spherical void. In this paper, a more general investigation of this phenomenon of field enhancement is undertaken by extending the study to ellipsoidal voids
  • Keywords
    partial discharges; PD-related stresses; bulk dielectric; ellipsoidal voids; field enhancement; solid dielectric; Boundary conditions; Dielectrics; Ellipsoids; Fault location; Partial discharges; Permittivity; Physics; Power engineering and energy; Stress; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    0-7803-1950-8
  • Type

    conf

  • DOI
    10.1109/CEIDP.1994.591694
  • Filename
    591694
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1840946