DocumentCode :
1840980
Title :
Foreword
Author :
Chein-Wei Jen
fYear :
2005
fDate :
27-29 April 2005
Abstract :
Presents the welcome message from the conference proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Conference_Location :
Hsinchu, Taiwan
Print_ISBN :
0-7803-9060-1
Type :
conf
DOI :
10.1109/VDAT.2005.1500002
Filename :
1500002
Link To Document :
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