مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1840980

Title :

Foreword

Author :

Chein-Wei Jen

fYear :

2005

fDate :

27-29 April 2005

Abstract :

Presents the welcome message from the conference proceedings.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on

Conference_Location :

Hsinchu, Taiwan

Print_ISBN :

0-7803-9060-1

Type :

conf

DOI :

10.1109/VDAT.2005.1500002

Filename :

1500002

Link To Document :