• DocumentCode
    1840981
  • Title

    An offset compensation technique for bandgap voltage reference in CMOS technology

  • Author

    Ruzza, S. ; Dallago, E. ; Venchi, G. ; Morini, S.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Pavia, Pavia
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    2226
  • Lastpage
    2229
  • Abstract
    A precision integrated bandgap voltage reference in 0.35 mum CMOS technology is here presented. The circuit uses natural npn bipolar transistors as reference diodes. A particular attention was paid to the compensation of the several offsets that could strongly influence the performances of the reference. A very simple sample and hold technique for offset compensation is here presented. The proposed technique is straight forward for all bandgap topologies which use diodes with a terminal connected to the ground node or to the supply node. The temperature coefficient (TC) of the generated output voltage is 12.7 ppm/degC versus about 245 ppm/degC of the same circuit without offset compensation. A full description and an analytical expression for the proposed compensation technique are given. The results of the most relevant simulations are also reported. The circuit has been inserted in a test chip whose layout is shown.
  • Keywords
    CMOS integrated circuits; compensation; reference circuits; transistor circuits; CMOS technology; bandgap voltage reference; bipolar transistor circuits; offset compensation; reference diodes; sample and hold; size 0.35 mum; temperature coefficient; Bipolar transistors; CMOS technology; Circuit simulation; Circuit testing; Circuit topology; Diodes; Integrated circuit technology; Land surface temperature; Photonic band gap; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4541895
  • Filename
    4541895