• DocumentCode
    1841033
  • Title

    The evaluation of high-reliability adhesive film for T-BGA

  • Author

    Otsuka, Masashi ; Yamagata, Osamu ; Imoto, Takashi ; Takano, Terunari ; Takahashi, Kenji ; Nakayoshi, Hideo

  • Author_Institution
    Microelectron. Center, Toshiba Corp., Kawasaki, Japan
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    1167
  • Lastpage
    1172
  • Abstract
    In the volume production of Tape Ball Grid Array (T-BGA), prevention of delamination between the polyamide tape and the adhesive film has been a serious challenge to the semiconductor packaging community. Since the delamination usually causes solder ball short during the solder reflow process, it is necessary to clarify the mechanism of the delamination as well as to improve the characteristics of the adhesive film. With a view to secure the stable productivity and reliability of the package, we investigated the three following physical characteristics of the adhesive in an attempt to acquire the optimal adhesive solution: resistance to reflow delamination; thermal fatigue; and longer storage life
  • Keywords
    adhesion; adhesives; delamination; integrated circuit packaging; integrated circuit reliability; microassembling; polymer films; reflow soldering; thermal stress cracking; T-BGA package; ball grid array; delamination prevention; evaluation methods; fatigue failure; high-reliability adhesive film; peel strength; polyamide tape; polyimide film; reflow delamination resistance; semiconductor packaging; soak condition; solder balls; solder reflow process; storage life; stress simulation; tape BGA package; thermal expansion; thermal fatigue; thermal mismatch; thermosetting adhesive; volume production; Delamination; Fatigue; Polyimides; Production; Productivity; Rubber products; Semiconductor device packaging; Semiconductor films; Thermal expansion; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678864
  • Filename
    678864