DocumentCode
1841357
Title
Narrowband vs. Broadband Phase Synchronization Analysis Applied to Independent Components of Ictal and Interictal EEG
Author
Gupta, D. ; James, C.J.
Author_Institution
Univ. of Southampton, Southampton
fYear
2007
fDate
22-26 Aug. 2007
Firstpage
3864
Lastpage
3867
Abstract
This paper presents a comparison of the use of broadband and narrow band signals for phase synchronization analysis as applied to Independent Components of ictal and interictal scalp EEG in the context of seizure onset detection and prediction. Narrow band analysis for phase synchronization is found to be better performed in the present context than the broad band signal analysis. It has been observed that the phase synchronization of Independent Components in a narrow band (particularly the Gamma band) shows a prominent trend of increasing and decreasing synchronization at seizure onset near the epileptogenic area (spatially). This information is not always found to be consistent in analysis with the raw EEG signals, which may show spurious synchronization happening due to volume conduction effects. These observations lead us to believe that tracking changes in phase synchronization of narrow band activity, on continuous data records will be of great value in the context of seizure prediction.
Keywords
electroencephalography; independent component analysis; neurophysiology; broadband phase synchronization analysis; electroencephalogram; ictal EEG; independent component analysis; interictal scalp EEG; narrowband phase synchronization analysis; seizure onset; volume conduction effects; Biomedical measurements; Covariance matrix; Electroencephalography; Epilepsy; Frequency synchronization; Independent component analysis; Narrowband; Phase measurement; Scalp; Signal analysis; Algorithms; Electroencephalography; Humans; Predictive Value of Tests; Seizures; Signal Processing, Computer-Assisted;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location
Lyon
ISSN
1557-170X
Print_ISBN
978-1-4244-0787-3
Type
conf
DOI
10.1109/IEMBS.2007.4353176
Filename
4353176
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