DocumentCode :
1841419
Title :
The development of a top-bottom-BGA (TB-BGA)
Author :
Leutenbauer, Rudolf ; Grosser, Volker ; Michel, Bernd ; Reichl, Herbert
Author_Institution :
Dept. of Mech. Reliability & Micro Mater., Fraunhofer-Inst., Berlin, Germany
fYear :
1998
fDate :
25-28 May 1998
Firstpage :
1235
Lastpage :
1240
Abstract :
A “top bottom ball grid array” (TB-BGA) is described, that takes advantage of existing BGA- and CSP-techniques, to create a new package for SCMs, MCMs, sensors and actuators. By using a pin-compatible BGA configuration at the bottom and the top of the carrier, a 3D stack assembly of several TB-BGAs is possible. Considering thermomechanical reliability, the compact stack assembly reduces bending loads and shear forces by using suitable materials, The area configuration of solder balls ensures a good thermal conductivity. As demonstrators, ceramic TB-BGAs are actually developed as single chip modules (SCMs) and few chip modules (FCMs). They will be mounted as intelligent sensor bus interfaces in conventional sensor casings. A full operating 16-bit-processor-unit including microcontroller, S-RAM, EEPROM physical CAN bus interface, oscillator and SMD components will require a volume of only 1.5 cm3
Keywords :
ball grid arrays; chip scale packaging; integrated circuit reliability; multichip modules; thermal conductivity; 3D stack assembly; CSP-techniques; EEPROM physical CAN bus interface; MCM; SCM; SMD components; SRAM; TB-BGA; actuators; area configuration; bending loads; few chip modules; intelligent sensor bus interfaces; microcontroller; oscillator; pin-compatible BGA configuration; processor-unit; sensors; shear forces; single chip modules; thermal conductivity; thermomechanical reliability; top-bottom-BGA; Actuators; Assembly; Conducting materials; Electronics packaging; Intelligent sensors; Materials reliability; Sensor arrays; Sensor phenomena and characterization; Thermal conductivity; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
ISSN :
0569-5503
Print_ISBN :
0-7803-4526-6
Type :
conf
DOI :
10.1109/ECTC.1998.678892
Filename :
678892
Link To Document :
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