DocumentCode
1841437
Title
Characterizing devices using the IEC 61000-4-5 surge stress
Author
Marum, Steve ; Kemper, Wolfgang ; Lin, Yen-Yi ; Barker, Paul
Author_Institution
Marum Consulting, Sherman, TX, USA
fYear
2012
fDate
9-14 Sept. 2012
Firstpage
1
Lastpage
9
Abstract
Many systems need to survive the IEC 61000-4-5 surge stress. Characterizing protection devices and input circuitry using this stress pulse provides information useful when designing such systems. Data taken with this surge pulse can also be used to determine ESD behavior.
Keywords
IEC standards; electrostatic discharge; stress analysis; surge protection; ESD behavior; IEC 61000-4-5 surge stress; characterizing devices; protection devices; stress pulse; surge pulse; Electrostatic discharges; Fingers; IEC standards; Metals; Stress; Surge protection; Surges;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location
Tucson, AZ
ISSN
0739-5159
Print_ISBN
978-1-4673-1467-1
Type
conf
Filename
6333338
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