Workshop and panel discussions: A1. EOS versus ESD. Definition, field failures, and case studies

Avoiding semiconductor failures requires a detailed knowledge of the conditions and circumstances causing the failures. Distinguishing between discharging events (ESD) and operation out of a semiconductor´s specification (EOS) can be important in determining the ultimate root cause. In fact, misdiagnosing EOS as ESD can cause lost debug time and improper data collection. This workshop will address questions regarding this critical distinction using examples from defects in automotive electronics. Bring your questions and examples to explore the difference between EOS and ESD.