DocumentCode
1841496
Title
2010 Best Paper Award
fYear
2012
fDate
9-14 Sept. 2012
Firstpage
1
Lastpage
1
Abstract
The 2010 Best Paper Award was presented to Yiqun Cao, Ulrich Glaser, Joost Willemen, Stephan Frei, and Matthias Stecher (of Infineon Technologies, and Technische Universitat Dortmund, Germany) for their article "On the Dynamic Destruction of LDMOS Transistors Beyond Voltage Overshoots in High Voltage ESD."
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location
Tucson, AZ, USA
ISSN
0739-5159
Print_ISBN
978-1-4673-1467-1
Type
conf
Filename
6333341
Link To Document