• DocumentCode
    1841505
  • Title

    2010 Symposium Outstanding Paper Award

  • fYear
    2012
  • fDate
    9-14 Sept. 2012
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The 2010 Symposium Outstanding Paper Award was presented to Gianluca Boselli, Akram Salman,Jonathan Brodsky, and Hans Kunz (of Texas Instruments, Inc.) for their article "The Relevance of Long-Duration TLP Stress on System Level ESD Design."
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
  • Conference_Location
    Tucson, AZ, USA
  • ISSN
    0739-5159
  • Print_ISBN
    978-1-4673-1467-1
  • Type

    conf

  • Filename
    6333342
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1841505