• DocumentCode
    1841526
  • Title

    A process- and temperature-tolerant power-on reset circuit with a flexible detection level higher than the bandgap voltage

  • Author

    Tanzawa, Toru

  • Author_Institution
    Micron Japan, Japan Flash Design Center, Tokyo
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    2302
  • Lastpage
    2305
  • Abstract
    A process- and temperature-tolerant power-on reset (POR) circuit is described. The operation principle of the POR circuit is based on a Kuijk cell bandgap reference with one resistor added to enable a designed output voltage higher than the Bandgap voltage of 1.25V. A test circuit with a detection level of 2.0V was fabricated and measured with a temperature variation of 19mV from 25degC to 90degC and a standard deviation of 25mV across one wafer. The circuit occupies 0.064mm2 and dissipates 1.2A at 90degC.
  • Keywords
    analogue integrated circuits; integrated circuit design; LSI; POR; bandgap voltage; integrated circuit design; large scale integration; power-on reset circuit; resistor; standard deviation; test circuit; Analog circuits; Circuit testing; Equations; Flexible printed circuits; Latches; Photonic band gap; Resistors; Temperature dependence; Temperature measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4541914
  • Filename
    4541914
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1841526