DocumentCode :
1841552
Title :
Probabilistic prediction of wireability and routing requirements for high density interconnect substrates
Author :
Diaz-Alvarez, E. ; Krusius, J.P.
Author_Institution :
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
fYear :
1998
fDate :
25-28 May 1998
Firstpage :
1265
Lastpage :
1269
Abstract :
Estimation of wiring and routability requirements for printed wiring boards (PWB), multi-chip modules (MCM), integrated circuit (IC´s) and other high density substrates, such as micro-via, is crucial for the development of new technologies, design, and CAD tools. This paper describes a new approach to wireability estimation that goes beyond the outmoded Rent´s rule by utilizing data flow and placement information available at the early stages of the design process. Excellent overall agreement between our predictions and published wiring data has been obtained for two actual MCM implementations. The relationship between placement and wireability will be presented through an optimization study considering wiring parameters and their distributions as metrics. This study will also serve the application of this work to other problems
Keywords :
circuit CAD; circuit optimisation; integrated circuit interconnections; multichip modules; printed circuit design; probability; substrates; CAD tools; MCM implementation; data flow; high density interconnect substrates; high density substrates; integrated circuit; micro-via; multi-chip modules; optimization; printed wiring boards; probabilistic prediction; routability; routing requirements; wireability; wireability estimation; wiring; wiring data; wiring parameters; Adders; Bonding; Information analysis; Joining processes; Logic; Multiplexing; Packaging; Process design; Routing; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
ISSN :
0569-5503
Print_ISBN :
0-7803-4526-6
Type :
conf
DOI :
10.1109/ECTC.1998.678901
Filename :
678901
Link To Document :
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