• DocumentCode
    1841747
  • Title

    Broadband, nonuniform stripline directional couplers for use in VNA testsets

  • Author

    Hrobak, Michael ; Sterns, Michael ; Seler, Ernst ; Schrauder, Thomas ; Schramm, Marcus ; Schmidt, Lorenz-Peter

  • Author_Institution
    High Freq. Technol. (LHFT), Friedrich-Alexander-Univ. (FAU) of Erlangen-Nuremberg, Erlangen-Nuremberg, Germany
  • fYear
    2012
  • fDate
    12-14 March 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Scattering parameter testsets of vector network analyzer (VNA) base instruments require backward wave directional couplers with sufficiently high directivity. This paper describes a synthesis procedure of symmetric, nonuniform couplers based on common multilayer printed circuit board (PCB) technology. The utilized offset coupled striplines (STL) are characterized by 2D electromagnetic (EM) field simulations in the frequency domain. Two loose directional couplers with directivity values greater than 15 dB from 0.003 MHz to 40 GHz resp. 29 GHz and greater than 5 dB up to 50 GHz resp. 70 GHz are proposed. The necessity of well matched transitions from STL to microstrip line (MSL) is outlined and two possible realizations are discussed. Measurement data of the manufactured couplers is presented, the arising deviations are clearly mapped to specific manufacturing tolerances. The minimum requirements for the applied PCB technology that guarantee successful designs are highlighted.
  • Keywords
    S-parameters; UHF couplers; directional couplers; frequency-domain analysis; microstrip transitions; network analysers; printed circuits; 2D electromagnetic field; EM field simulations; PCB technology; VNA base instruments; VNA test sets; backward wave directional couplers; broadband nonuniform stripline directional couplers; common multilayer printed circuit board technology; frequency 0.003 MHz to 40 GHz; frequency domain; loose directional couplers; manufacturing tolerances; measurement data; microstrip line; offset coupled striplines; scattering parameter test sets; vector network analyzer; Couplings; Directional couplers; Impedance; Nonhomogeneous media; Strips; Three dimensional displays; Broadband Directional Coupler; Nonuniform High Directivity Backward Wave Directional Coupler; Scattering Parameter Testset; Stripline to Microstrip Transition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (GeMiC), 2012 The 7th German
  • Conference_Location
    Ilmenau
  • Print_ISBN
    978-1-4577-2096-3
  • Electronic_ISBN
    978-3-9812668-4-9
  • Type

    conf

  • Filename
    6185159