• DocumentCode
    1841810
  • Title

    Welding behavior of Ag/SnO2 contact material with microstructure and additive modifications

  • Author

    Leung, Chi ; Streicher, Eric ; Fitzgerald, Dennis

  • fYear
    2004
  • fDate
    20-23 Sept. 2004
  • Firstpage
    64
  • Lastpage
    69
  • Abstract
    Silver cadmium oxide (Ag/CdO) has been the preferred material for contacts due to its excellent performance properties and ease of manufacture into many configurations. Many alternative CdO free contacts, particularly silver tin oxide (Ag/SnO2), are much more difficult to fabricate because of poor metallurgical properties. This leads to low process yields and higher costs. One correction is to have different mixing techniques to form more workable high oxide content microstructures. Another more simple solution is to have the least amount of oxides in the soft silver matrix. This latter approach is possible only if the anti-welding and arc erosion properties are sufficient. For this study several tin oxide mixtures are compared that can bridge the performances between pure Ag and 85 Ag/15 CdO. This included low oxide content composites with 2 to 8% oxides, mixed oxides with various silver particle sizes and mixes using the advantages of minor oxide additives. In this report, the welding properties are compared to help with contact selection.
  • Keywords
    crystal microstructure; electrical contacts; particle size; silver; tin compounds; welding; Ag-SnO2; Ag/SnO2 contact material; CdO free contacts; additive modifications; antiwelding; arc erosion properties; metallurgical properties; microstructure modifications; mixing techniques; oxide additives; silver cadmium oxide; silver particle mixes; silver particle sizes; silver tin oxide; soft silver matrix; tin oxide mixtures; welding properties; Additives; Cadmium compounds; Contacts; Manufacturing; Microstructure; Oxidation; Powders; Silver; Tin; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
  • Print_ISBN
    0-7803-8460-1
  • Type

    conf

  • DOI
    10.1109/HOLM.2004.1353096
  • Filename
    1353096