• DocumentCode
    1841882
  • Title

    Comparing unloaded Q-factor of a high-Q dielectric resonator measured using the transmission mode and reflection mode methods involving S-parameter circle fitting

  • Author

    Leong, K. ; Mazierska, J. ; Jacob, M.V. ; Ledenyov, D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., James Cook Univ., Townsville, Qld., Australia
  • Volume
    3
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    1665
  • Abstract
    A comparative study of unloaded Q-factor measurements of a TE/sub 011/ mode sapphire dielectric resonator with unloaded Q-factor value of 731,000 at a frequency of 10 GHz and temperature of 65 K using two best Q-factor measurement methods are presented. The transmission (TMQF) and reflection methods are based on relevant multifrequency S-parameter measurements and circle-fitting procedures to compute the unloaded Q-factor of the resonator. For accurate comparison of the methods, a delay compensation procedure (introduced in the TMQF technique to remove delay due to noncalibrated cables) has been applied also to the reflection data.
  • Keywords
    Q-factor; S-parameters; cavity resonators; compensation; curve fitting; delays; dielectric resonators; electromagnetic wave reflection; electromagnetic wave transmission; microwave measurement; 10 GHz; 65 K; Q-factor measurement methods; S-parameter circle fitting; TE/sub 011/ mode sapphire dielectric resonator; TMQF technique; circle-fitting procedures; delay compensation procedure; high-Q dielectric resonator; multifrequency S-parameter measurements; noncalibrated cable delay; reflection data; reflection mode measurement method; transmission mode measurement method; unloaded Q-factor; unloaded Q-factor measurements; Coupling circuits; Delay; Dielectric measurements; Frequency measurement; Microwave measurements; Q factor; Q measurement; Reflection; Resonance; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1012178
  • Filename
    1012178