DocumentCode
1841972
Title
An updated view of the aluminum contact interface
Author
Aronstein, J.
fYear
2004
fDate
20-23 Sept. 2004
Firstpage
98
Lastpage
103
Abstract
The properties and behavior of aluminum in electrical power connections have been extensively studied for more than 50 years. This work provides an overview of several key aspects of the aluminum contact interface. Examined in the light of experimental and theoretical information available today, some popular concepts of the aluminum contact interface that were developed many years ago are seen to be incorrect. The topics addressed are the wide variability of the oxide film, "self healing", "glowing" connections, and the effect of high current density at the metallic conducting spots within the contact.
Keywords
aluminium; contact resistance; current density; electrical contacts; thin films; Al; aluminum contact interface; current density; electrical power connections; glowing connections; metallic conducting spots; oxide film; self healing connections; Aluminum; Conductive films; Conductors; Connectors; Optical films; Rough surfaces; Surface cracks; Surface resistance; Surface roughness; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN
0-7803-8460-1
Type
conf
DOI
10.1109/HOLM.2004.1353101
Filename
1353101
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