DocumentCode :
1841972
Title :
An updated view of the aluminum contact interface
Author :
Aronstein, J.
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
98
Lastpage :
103
Abstract :
The properties and behavior of aluminum in electrical power connections have been extensively studied for more than 50 years. This work provides an overview of several key aspects of the aluminum contact interface. Examined in the light of experimental and theoretical information available today, some popular concepts of the aluminum contact interface that were developed many years ago are seen to be incorrect. The topics addressed are the wide variability of the oxide film, "self healing", "glowing" connections, and the effect of high current density at the metallic conducting spots within the contact.
Keywords :
aluminium; contact resistance; current density; electrical contacts; thin films; Al; aluminum contact interface; current density; electrical power connections; glowing connections; metallic conducting spots; oxide film; self healing connections; Aluminum; Conductive films; Conductors; Connectors; Optical films; Rough surfaces; Surface cracks; Surface resistance; Surface roughness; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN :
0-7803-8460-1
Type :
conf
DOI :
10.1109/HOLM.2004.1353101
Filename :
1353101
Link To Document :
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