• DocumentCode
    1842027
  • Title

    Characterization of underfill materials for functional solder bumped flip chips on board applications

  • Author

    Lau, John H. ; Chang, Chris

  • Author_Institution
    Express Packaging Syst. Ltd., Palo Alto, CA, USA
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    1361
  • Lastpage
    1370
  • Abstract
    The curing conditions and material properties such as the TCE (thermal coefficient of expansion), Tg (glass transition temperature), flexural storage modulus, tangent delta, and moisture content of nine different underfill materials from three different vendors are measured. Their flow rate and the effect of moisture content on mechanical (shear) strength in solder bumped flip chips on organic substrate are also determined experimentally. Furthermore, their effects on the electrical performance (voltage) of functional flip chip devices on organic substrate are measured. Finally, a simple methodology is presented for the selection of underfills from the measurement results of these nine different underfill materials
  • Keywords
    chip-on-board packaging; elastic moduli; encapsulation; flip-chip devices; glass transition; moisture; polymer blends; shear strength; soldering; thermal expansion; COB; TCE; curing conditions; electrical performance; epoxy resins; flexural storage modulus; flip chips on board applications; flow rate; glass transition temperature; material properties; mechanical strength; moisture content; organic substrate; shear strength; solder bumped flip chips; tangent delta; thermal coefficient of expansion; underfill materials; Curing; Flip chip; Glass; Material properties; Material storage; Moisture measurement; Semiconductor device measurement; Temperature; Thermal expansion; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678921
  • Filename
    678921