• DocumentCode
    1842203
  • Title

    Compact LNA and VCO 3-D MMICs using commercial GaAs PHEMT technology for V-band single-chip TRX MMIC

  • Author

    Nishikawa, K. ; Piernas, B. ; Kamogawa, K. ; Nakagawa, T. ; Araki, K.

  • Author_Institution
    NTT Network Innovation Labs., Yokosuka, Japan
  • Volume
    3
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    1717
  • Abstract
    This paper presents compact V-band low-noise amplifier (LNA) and Ka-band voltage-control oscillator (VCO) 3-D MMICs for a V-band highly-integrated single-chip transceiver MMIC. 3-D MMICs are fabricated through the cooperation of commercial foundry GaAs pHEMT and 3-D interconnection processes. The LNA (chip size is 0.75 mm/sup 2/) achieves 15 dB gain and better than 3.3 dB noise figure from 50 GHz to 60 GHz. The VCO (chip size of 0.52 mm) achieves 11.5 dBm output power, 3.8 GHz oscillation frequency tuning range, and a phase noise of -102 dBc/Hz at 1 MHz offset and 28.6 GHz output signal. The cooperation 3-D MMIC technology with a high-performance commercial foundry technology promises low-cost, compact, and high performance millimeter-wave MMICs.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MMIC amplifiers; MMIC oscillators; field effect MIMIC; field effect MMIC; gallium arsenide; integrated circuit noise; millimetre wave amplifiers; millimetre wave oscillators; transceivers; voltage-controlled oscillators; 15 dB; 28.6 GHz; 3.3 dB; 3D interconnection processes; 50 to 60 GHz; EHF; GaAs PHEMT technology; Ka-band voltage-control oscillator; MM-wave MMICs; V-band low-noise amplifier; V-band single-chip TRX MMIC; commercial foundry GaAs pHEMT processes; compact LNA 3D MMICs; compact VCO 3D MMICs; frequency tuning range; phase noise; single-chip transceiver MMIC; Foundries; Gain; Gallium arsenide; Low-noise amplifiers; MMICs; Noise figure; PHEMTs; Power generation; Transceivers; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1012191
  • Filename
    1012191