Title :
Relationship between initial thermal characteristics and lifetime projection of semiconductor laser diodes
Author :
Hwang, Nam ; Lee, Sang Hwan ; Chong, Gwan ; Song, Min Kyu ; Pyun, Kwang Eui
Author_Institution :
Semiconductor Res. Div., Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
A novel reliability projection model of semiconductor laser diodes (LD) is presented. By correlating initial thermal characteristics and long-term degradation, a relationship between LD degradation and ambient temperature has been investigated. The proposed model is found to be efficient for the reliability projection of LDs, which requires a thermal characterization only at t=0
Keywords :
extrapolation; laser reliability; semiconductor device reliability; semiconductor lasers; ambient temperature; initial thermal characteristics; lifetime projection; long-term degradation; reliability projection model; semiconductor laser diodes; Accelerated aging; Current measurement; Diode lasers; Electronic mail; Laser modes; Monitoring; Semiconductor lasers; Temperature; Testing; Thermal degradation;
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4526-6
DOI :
10.1109/ECTC.1998.678930
