Title :
Overview of High Power and Large Signal Measurements and Calibration
Author_Institution :
Research and Technology Manager, Santa Rosa Systems Division, Hewlett Packard, 1400 Fountain Grove Parkway, Santa Rosa, CA 95403
Abstract :
This paper is an overview of the present state of the art in high power measurement methods. It certainly does not cover all aspects and approaches, but is meant to give a flavor of some of the key advances using these technologies.
Keywords :
Calibration; Impedance matching; Impedance measurement; Nonlinear equations; Power amplifiers; Power generation; Power measurement; Radiofrequency amplifiers; Scattering parameters; Tuners;
Conference_Titel :
ARFTG Conference Digest-Spring, 47th
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1996.327167
