• DocumentCode
    1842305
  • Title

    Electrical conduction through small contact spots

  • Author

    Timsit, R.S.

  • Author_Institution
    Timron Sci. Consulting Inc., Toronto, Ont., Canada
  • fYear
    2004
  • fDate
    20-23 Sept. 2004
  • Firstpage
    184
  • Lastpage
    191
  • Abstract
    Earlier literature has reported that the voltage-temperature (V-T) relation for electrical contacts, and classical electrical contact theory in general, are invalid where the a-spots are on the order of nanometers. This work reviews earlier literature dealing with the breakdown of the V-T relation and presents quantitative arguments to propose that this breakdown stems from the ballistic motion of electrons through nanometer-sized constrictions. Earlier literature also suggested that the breakdown of classical theory stems in part from thermal losses from a-spots to contaminant layers in an electrical interface. Through the use of a simple a-spot model, This work shows that this cooling mechanism is not sufficiently important to affect the validity of the classical V-T relation and classical electrical contact theory in general.
  • Keywords
    aluminium; contact resistance; electrical conductivity; electrical contacts; nanocontacts; tin; Al-Al; Sn-Sn; a-spot model; ballistic motion; contaminant layers; cooling mechanism; electrical conduction; electrical contact theory; electrical interface; nanocontacts; small contact spots; thermal losses; voltage-temperature relation; Contact resistance; Cooling; Electric breakdown; Electric resistance; Electrons; Nanocontacts; Resistance heating; Temperature; Thermal conductivity; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
  • Print_ISBN
    0-7803-8460-1
  • Type

    conf

  • DOI
    10.1109/HOLM.2004.1353116
  • Filename
    1353116