DocumentCode :
1842339
Title :
Automatic generation of software/hardware co-emulation interface for transaction-level communication
Author :
Kim, Young-Il ; Ki-Yong Aim ; Shim, Heejun ; Yang, Wooseung ; Kwon, Young-Su ; Ki, Ando ; Kyung, Chong-Min
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear :
2005
fDate :
27-29 April 2005
Firstpage :
196
Lastpage :
199
Abstract :
This paper presents a methodology for generating interface of a co-emulation system where processor and emulator execute testbench and design unit, respectively while interacting with each other. To reduce the communication time between the processor and emulator, data transfers are performed in transaction level instead of signal level. To do this, transactor should be located near the DUT mapped on the hardware emulator. Consequently transactor is described in a synthesizable way. Moreover, the transactor design depends on both emulator system protocol and DUT protocol. Therefore, transactor description would not only be time-consuming but also error-prone task. Based on the layered architecture, we propose an automated procedure for generating co-emulation interface from platform-independent transactor. We have also discussed about the practical issues on multiple channel and clock skew problem.
Keywords :
automatic test pattern generation; circuit simulation; design for testability; hardware description languages; hardware-software codesign; integrated circuit design; DUT protocol; clock skew problem; coemulation system; emulator system protocol; hardware emulator; multiple channel problem; software-hardware coemulation interface; testbench; transaction-level communication; transactor design; Clocks; Computer architecture; Decoding; Emulation; Engines; Hardware; Protocols; Software systems; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Print_ISBN :
0-7803-9060-1
Type :
conf
DOI :
10.1109/VDAT.2005.1500054
Filename :
1500054
Link To Document :
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