DocumentCode
1842346
Title
Versatile W-band On-wafer MMIC Test Set
Author
Lin, E.W. ; Huang, T.W. ; Lo, D.C.W. ; Wang, H. ; Yang, D.C. ; Dow, G.S. ; Allen, B.R.
Author_Institution
TRW, Space and Electronics Group, One Space Park, M5/1041E, Redondo Beach, CA 90278
Volume
29
fYear
1996
fDate
35217
Firstpage
95
Lastpage
101
Abstract
This paper describes the successful characterization of various W-band MMICs uniquely different in function using an automated on-wafer test set. Several thousand MMICs, including low-noise amplifiers, mixers, VCOs, and detectors, have been tested for gain, noise figure, tuning range, and responsivity, respectively. The ability of the test set to easily accommodate the individual test requirements of the different MMICs is important in establishing a high throughput system and demonstrates both its versatility and flexibility.
Keywords
Automatic testing; Circuit testing; Detectors; Gain measurement; Low-noise amplifiers; MMICs; Noise figure; Noise measurement; Probes; Waveguide transitions;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 47th
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1996.327169
Filename
4119841
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