• DocumentCode
    1842420
  • Title

    Waveform Measurements on a HEMT Resistive Mixer

  • Author

    Schreurs, D. ; Verspecht, J. ; Nauwelaers, B. ; Barel, A. ; Van Rossum, M.

  • Author_Institution
    K.U. Leuven, div. ESAT-TELEMIC, Kard. Mercierlaan 94, B-3001 Heverlee, Belgium, phone: +32-16-281485, fax: +32-16-281214, e-mail: schreurs@imec.be
  • Volume
    29
  • fYear
    1996
  • fDate
    35217
  • Firstpage
    129
  • Lastpage
    135
  • Abstract
    Calibrated on-wafer waveform measurements under two-tone stimuli are demonstrated on a HEMT, configured as a resistive mixer. These large-signal measurements allow us not only to determine the conventional performance parameters, but also to analyse the influence of the phase relationship between the two excitation signals on the characteristics. For the considered HEMT resistive mixer, the dependency of the intermodulation products on the phase relationship between the LO-signal and the RF-signal becomes significant at high RF-powers.
  • Keywords
    Calibration; Current measurement; HEMTs; Microwave devices; Microwave measurements; Phase measurement; Resistors; Scattering; Signal analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 47th
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1996.327173
  • Filename
    4119845