DocumentCode
1842420
Title
Waveform Measurements on a HEMT Resistive Mixer
Author
Schreurs, D. ; Verspecht, J. ; Nauwelaers, B. ; Barel, A. ; Van Rossum, M.
Author_Institution
K.U. Leuven, div. ESAT-TELEMIC, Kard. Mercierlaan 94, B-3001 Heverlee, Belgium, phone: +32-16-281485, fax: +32-16-281214, e-mail: schreurs@imec.be
Volume
29
fYear
1996
fDate
35217
Firstpage
129
Lastpage
135
Abstract
Calibrated on-wafer waveform measurements under two-tone stimuli are demonstrated on a HEMT, configured as a resistive mixer. These large-signal measurements allow us not only to determine the conventional performance parameters, but also to analyse the influence of the phase relationship between the two excitation signals on the characteristics. For the considered HEMT resistive mixer, the dependency of the intermodulation products on the phase relationship between the LO-signal and the RF-signal becomes significant at high RF-powers.
Keywords
Calibration; Current measurement; HEMTs; Microwave devices; Microwave measurements; Phase measurement; Resistors; Scattering; Signal analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 47th
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1996.327173
Filename
4119845
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