Title :
Waveform Measurements on a HEMT Resistive Mixer
Author :
Schreurs, D. ; Verspecht, J. ; Nauwelaers, B. ; Barel, A. ; Van Rossum, M.
Author_Institution :
K.U. Leuven, div. ESAT-TELEMIC, Kard. Mercierlaan 94, B-3001 Heverlee, Belgium, phone: +32-16-281485, fax: +32-16-281214, e-mail: schreurs@imec.be
Abstract :
Calibrated on-wafer waveform measurements under two-tone stimuli are demonstrated on a HEMT, configured as a resistive mixer. These large-signal measurements allow us not only to determine the conventional performance parameters, but also to analyse the influence of the phase relationship between the two excitation signals on the characteristics. For the considered HEMT resistive mixer, the dependency of the intermodulation products on the phase relationship between the LO-signal and the RF-signal becomes significant at high RF-powers.
Keywords :
Calibration; Current measurement; HEMTs; Microwave devices; Microwave measurements; Phase measurement; Resistors; Scattering; Signal analysis; Voltage;
Conference_Titel :
ARFTG Conference Digest-Spring, 47th
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1996.327173
