• DocumentCode
    1842503
  • Title

    Non arcing electric contact device using the MEMS multi-electrodes

  • Author

    Yonezawa, Yu. ; Wakatsuki, Noboru ; Satoh, Yoshio ; Nakatani, Tadashi ; Sawa, Koichiro

  • Author_Institution
    Ishinomaki Senshu Univ., Japan
  • fYear
    2004
  • fDate
    20-23 Sept. 2004
  • Firstpage
    236
  • Lastpage
    241
  • Abstract
    We proposed a new electric contact device that suppresses the arc phenomena. Electric contact functions are divided into energizing and switching. Switching contacts are the multi-electrodes and each electrode current is suppressed by series resistance. For realizing of the multi-contacting, cantilever beam array electrodes were formed on silicon substrate using micro electromechanical systems (MEMS) technology. Finite element method was used for optimizing structure. Reactive ion etching was used for making of cantilever. 0.97 A of contact current was broken by the Au plating electrodes.
  • Keywords
    arcs (electric); contact resistance; electrical contacts; electrodes; electroplating; elemental semiconductors; finite element analysis; gold; microswitches; silicon; sputter etching; 0.97 A; Au; Au plating electrodes; MEMS multielectrodes; Si; cantilever beam array electrodes; contact current; electric contact functions; finite element method; ion etching; microelectromechanical systems technology; nonarcing electric contact device; series resistance; silicon substrate; switching contacts; Contact resistance; Electric resistance; Electrodes; Electromechanical systems; Etching; Finite element methods; Micromechanical devices; Optimization methods; Silicon; Structural beams;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
  • Print_ISBN
    0-7803-8460-1
  • Type

    conf

  • DOI
    10.1109/HOLM.2004.1353124
  • Filename
    1353124