DocumentCode
1842520
Title
Complex permittivity determination from measured scattering parameters of TEM waveguide
Author
Savi, P. ; Niyazov, U. ; Maio, I.A.
Author_Institution
Dip. Elettron., Politec. di Torino, Torino, Italy
fYear
2011
fDate
12-16 Sept. 2011
Firstpage
1352
Lastpage
1355
Abstract
This paper addresses the de-embedding of the propagation function of waveguides from the scattering responses of setups composed of TEM waveguides terminated by launchers that introduce generic discontinuities. The de-embedding is aimed at estimating the permittivity of dielectric samples from the scattering responses of waveguides including the samples. The de-embedding is based on the double-delay method, that is applied to setups involving different launchers.
Keywords
electromagnetic wave scattering; permittivity; waveguides; TEM waveguide; complex permittivity determination; double-delay method; measured scattering parameters; scattering responses; waveguide propagation function; Dielectrics; Frequency measurement; Permittivity; Permittivity measurement; Scattering; Scattering parameters; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetics in Advanced Applications (ICEAA), 2011 International Conference on
Conference_Location
Torino
Print_ISBN
978-1-61284-976-8
Type
conf
DOI
10.1109/ICEAA.2011.6046548
Filename
6046548
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