A New Technique for Measuring the Scattering Parameters of Two-Port Junctions with a Single Multiport Reflectometer

Almost twenty years ago C.A. Hoer proposed the dual six-port system for measurements of the scattering parameters of two-port junctions"\´. The method was expected to be very promking owing to the absence of precise units of analog data processing, reference source and directional couplers in microwave tract. However, the conventional processing techniques of the data taken from the measuring ports allows one to determine only the complex ratio of reflected and incident waves at two-port reference planes. Therefore, it is rather difficult to measure the nonreciprocal hvo-poi-&p arameters S,, and S21.