DocumentCode :
1842798
Title :
Dual-block-pipelined VLSI architecture of entropy coding for H.264/AVC baseline profile
Author :
Chen, Tung-Chien ; Huang, Yu-Wen ; Tsai, Chuan-Yong ; Hsieh, Bing-Yu ; Chen, Liang-Gee
Author_Institution :
Dept. of Electr. Eng., National Taiwan Univ., Taipei, Taiwan
fYear :
2005
fDate :
27-29 April 2005
Firstpage :
271
Lastpage :
274
Abstract :
Direct VLSI implementation of context-based adaptive variable length coding (CAVLC) for residues, as a modification from conventional run-length coding, will lead to low throughput and utilization. In this paper, an efficient CAVLC design is proposed. The main concept is the two-stage block pipelining scheme for parallel processing of two 4×4-blocks. When one block is processed by the scanning engine to collect the required symbols, its previous block is handled by the coding engine to translate symbols into bitstream. The dual-block-pipelined architecture doubles the throughput and utilization of CAVLC at high bitrates. Moreover, a zero skipping technique is adopted to reduce up to 90% of cycles at low bitrates. Last but not least, exponential-Golomb coding for other general symbols and bitstream encapsulation for network abstraction layer are integrated with CAVLC engine as a complete entropy coder for H.264/AVC baseline profile. Simulation results show that our design is capable of real-time processing for 1920 × 1088 30fps videos with 23.6K logic gates at 100MHz.
Keywords :
VLSI; digital signal processing chips; encoding; hardware-software codesign; instruction sets; logic circuits; variable length codes; video coding; 100 MHz; CAVLC; H.264/AVC; VLSI; baseline profile; context based adaptive variable length coding; dual block pipelined architecture; entropy coding; exponential Golomb coding; parallel processing; Automatic voltage control; Bit rate; Encapsulation; Engines; Entropy coding; Parallel processing; Pipeline processing; Throughput; Very large scale integration; Videos;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Print_ISBN :
0-7803-9060-1
Type :
conf
DOI :
10.1109/VDAT.2005.1500073
Filename :
1500073
Link To Document :
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