DocumentCode
1842813
Title
Contact material and arc current affect on post-current zero contact surface temperature
Author
Shea, John J. ; Zhou, Xin
Author_Institution
Eaton Electr., Eaton Corp., Pittsburgh, PA, USA
fYear
2004
fDate
20-23 Sept. 2004
Firstpage
326
Lastpage
333
Abstract
Optical radiation measurements of contact surfaces were made after current-zero of a high-current (>10 kAp) arc, to determine how much the contact surface temperature at and after current zero was affected by a change in contact material and arc current. Contact surface temperature was measured for different types of "typical" contact materials (AgW and AgC) commonly used in molded case circuit breakers (MCCB\´s). The average temperature at the contact surface was measured by using photodiodes in conjunction with a narrow band filters and a long-range microscope. A 250 Amp rated MCCB was modified, with renewable chamber walls and contacts, and used as a test bed to insure that these results can be directly applied to MCCB\´s in the 125 to 250 Amp range. Uniform and repeatable arcing conditions were maintained by using an electronically timed capacitor bank source, timed contact part, and a well-maintained arc chamber. Along with other important engineering properties of the contacts (arc erosion, temperature rise), this data can be useful for selecting contacts for circuit breaker applications.
Keywords
circuit breakers; circuit-breaking arcs; photodiodes; 125 to 250 A; AgW-AgC; arc chamber; arc current; arc erosion; arcing conditions; contact material; current zero contact surface temperature; electronic timed capacitor bank source; engineering properties; molded case circuit breakers; narrow band filters; optical microscopy; optical radiation measurements; photodiodes; renewable chamber walls; test bed; Capacitors; Circuit breakers; Circuit testing; Current measurement; Microscopy; Narrowband; Optical filters; Optical materials; Photodiodes; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN
0-7803-8460-1
Type
conf
DOI
10.1109/HOLM.2004.1353137
Filename
1353137
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