Simulations of noise-parameter uncertainties

Author

Randa, J.

Author_Institution

RF Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA

Volume

3

fYear

2002

fDate

2-7 June 2002

Firstpage

1845

Abstract

This paper reports results for uncertainties obtained from a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlying quantities. Results have been obtained for the effect due to uncertainties in the reflection coefficients of the input terminations, the noise temperature of the hot noise source, connector variability, the ambient temperature, and the measurement of the output noise. Representative results are presented for both uncorrelated and correlated uncertainties in the underlying quantities.

Keywords

Monte Carlo methods; electric noise measurement; measurement uncertainty; Monte Carlo simulation; ambient temperature; connector variability; hot noise source; input termination; measurement uncertainty; noise parameters; noise temperature; output noise; reflection coefficient; Acoustic reflection; Computational modeling; Equations; Measurement uncertainty; NIST; Noise measurement; Power measurement; Protection; Radiometry; Temperature measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2002 IEEE MTT-S International

Conference_Location

Seattle, WA, USA

ISSN

0149-645X

Print_ISBN

0-7803-7239-5

Type

conf

DOI

10.1109/MWSYM.2002.1012222

Filename

1012222