Title :
APRIS: Automatic Pattern Recognition and Inspection System
Author :
Mehenni, B. ; Wahab, M.A.
Author_Institution :
Dept. of Electron., Glamorgan Univ., UK
Abstract :
A fast visual automatic pattern recognition and inspection system is described. The major aim of the system is the recognition and inspection of 2D patterns and images in the printing industries. The strategy behind the system uses a hybrid structure combining the conventional n-tuple method and the pixel-by-pixel comparison method. Both of these methods lend themselves to a massively parallel hardware implementation using application specific integrated circuits (ASICs). High-density field programmable gate arrays (FPGAs) were chosen for the implementation of the system, providing the high speeds required by the automatic recognition and inspection of modern automated assembly lines
Keywords :
application specific integrated circuits; assembling; automatic optical inspection; image processing equipment; image recognition; logic arrays; parallel processing; printing industry; production engineering computing; 2D patterns; APRIS; ASICs; Automatic Pattern Recognition and Inspection System; application specific integrated circuits; automated assembly lines; field programmable gate arrays; high density FPGA; massively parallel hardware implementation; n-tuple method; pixel-by-pixel comparison method; printing industries; Application specific integrated circuits; Assembly; Costs; Field programmable gate arrays; Image recognition; Inspection; Pattern recognition; Printing; Prototypes; Shape;
Conference_Titel :
CompEuro '93. 'Computers in Design, Manufacturing, and Production', Proceedings.
Conference_Location :
Pris-Evry
Print_ISBN :
0-8186-4030-8
DOI :
10.1109/CMPEUR.1993.289825
