Title :
k-NN based LS-SVM framework for long-term time series prediction
Author :
Huang, Zifang ; Shyu, Mei-Ling
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Miami, Coral Gables, FL, USA
Abstract :
Long-term time series prediction is to predict the future values multi-step ahead. It has received more and more attention due to its applications in predicting stock prices, traffic status, power consumption, etc. In this paper, a k-nearest neighbors (k-NN) based least squares support vector machine (LS-SVM) framework is proposed to perform long-term time series prediction. A new distance function, which integrates the Euclidean distance and the dissimilarity of the trend of a time series, is defined for the k-NN approach. By selecting similar instances (i.e., nearest neighbors) in the training dataset for each testing instance based on the k-NN approach, the complexity of training an LS-SVM regressor is reduced significantly. Experiments on two types of datasets were conducted to compare the prediction performance of the proposed framework with the traditional LS-SVM approach and the LL-MIMO (Multi-Input Multi-Output Local Learning) approach at the prediction horizon 20. The experimental results demonstrate that the proposed framework outperforms both traditional LS-SVM approach and LL-MIMO approach in prediction. Furthermore, experimental results also show the promising long-term prediction ability of the proposed framework even when the prediction horizon is large (up to 180).
Keywords :
learning (artificial intelligence); least squares approximations; mathematics computing; support vector machines; time series; Euclidean distance; LL-MIMO approach; LS-SVM framework; distance function; k-nearest neighbor; least squares support vector machine; long-term time series prediction; multiinput multioutput local learning; Artificial neural networks; Equations; Mathematical model; Predictive models; Testing; Time series analysis; Training;
Conference_Titel :
Information Reuse and Integration (IRI), 2010 IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-8097-5
DOI :
10.1109/IRI.2010.5558963