DocumentCode :
1843084
Title :
A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter
Author :
Chuang, Yao-Jen ; Ou, Hsin-Hung ; Liu, Bin-Da
Author_Institution :
Dept. of Electr. Eng., National Cheng Kung Univ., Tainan, Taiwan
fYear :
2005
fDate :
27-29 April 2005
Firstpage :
315
Lastpage :
318
Abstract :
A thermometer-to-binary encoder, which is suitable for high-speed and low-resolution flash-ADC, is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit. Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.
Keywords :
Gray codes; analogue-digital conversion; circuit simulation; encoding; integrated circuit design; low-power electronics; mixed analogue-digital integrated circuits; thermometers; Gray-ROM encoder; bubble induced error reduction; bubble tolerant thermometer-to-binary encoder; conversion speed; encoding scheme; flash A/D converter; one-out-of-N circuit; Analog-digital conversion; Binary codes; Circuits; Clocks; Delay; Delta-sigma modulation; Electronic mail; Encoding; Reflective binary codes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Print_ISBN :
0-7803-9060-1
Type :
conf
DOI :
10.1109/VDAT.2005.1500084
Filename :
1500084
Link To Document :
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