DocumentCode :
1843092
Title :
Storage and decay of electrical charge in high temperature dielectrics
Author :
Raju, G. R Govinda ; Sussi, M.A.
Author_Institution :
Dept. of Electr. Eng., Windsor Univ., Ont., Canada
fYear :
1991
fDate :
7-10 Oct 1991
Firstpage :
225
Lastpage :
229
Abstract :
The results of research into charge storage and its decay are reported for aromatic polyamides which are high-temperature dielectrics. Both thermal poling and corona charging techniques are used. Thermal poling is also carried out at various electric fields and TSD (thermally stimulated discharge) currents are measured by varying several parameters, such as the heating rate, material thickness, and storage temperature. The activation energy for the release of charges is determined by the plots of current and reciprocal of the temperature. The TSD current shows a peak at 135° for a rate of heating of 1 K/min and shifts to a higher value. The charge released to the external circuit is proportional to the poling field. The relaxation time for the delay of charges has been measured by a new experimental procedure, and it is concluded that the material shows dipolar relaxation at 135°C. A positive corona discharge in a point plane gap in air at atmospheric pressure is used for corona poling
Keywords :
corona; dielectric polarisation; dielectric relaxation; polymers; thermally stimulated currents; 135 degC; TSD; activation energy; aromatic polyamides; charge storage; corona charging; dipolar relaxation; electrical charge; heating rate; high temperature dielectrics; material thickness; poling field; relaxation time; storage temperature; thermal poling; Circuits; Corona; Current measurement; Dielectric materials; Dielectric measurements; Electric variables measurement; Material storage; Resistance heating; Temperature; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Electronics Insulation Conference, 1991. Boston '91 EEIC/ICWA Exposition., Proceedings of the 20th
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-0018-1
Type :
conf
DOI :
10.1109/EEIC.1991.162611
Filename :
162611
Link To Document :
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