• DocumentCode
    1843116
  • Title

    Feature selection using Sequential Forward Selection and classification applying Artificial Metaplasticity Neural Network

  • Author

    Marcano-Cedeño, A. ; Quintanilla-Domínguez, J. ; Cortina-Januchs, M.G. ; Andina, D.

  • Author_Institution
    Group for Autom. in Signals & Commun., Tech. Univ. of Madrid, Madrid, Spain
  • fYear
    2010
  • fDate
    7-10 Nov. 2010
  • Firstpage
    2845
  • Lastpage
    2850
  • Abstract
    The feature selection has been widely used to reduce the data dimensionality. Data reduction improve the classification performance, the approximation function, and pattern recognition systems in terms of speed, accuracy and simplicity. A strategy to reduce the number of features in local search are the sequential search algorithms. In this work is presented a feature selection method based on Sequential Forward Selection (SFS) and Feed Forward Neural Network (FFNN) to estimate the prediction error as a selection criterion. Three well-known database have been used to test the SFS-FFNN with Artificial Metaplasticity on Perceptron Multilayer (AMMLP). The AMMLP is a new method applied for classification of patterns. The results obtained by SFS-FFNN with AMMLP in classification accuracy are superior than obtained by conventional BP algorithm and other recent feature selection algorithms applied to the same database. By these reasons the proposed method SFS-FFNN with AMMLP is an interesting alternative to reduce the data dimensionality and provide a high accuracy.
  • Keywords
    data analysis; feature extraction; multilayer perceptrons; artificial metaplasticity neural network; artificial metaplasticity on perceptron multilayer; data dimensionality; data reduction; feed forward neural network; pattern recognition systems; sequential forward selection; Accuracy; Artificial neural networks; Databases; Iris; Iris recognition; Neurons; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Glendale, AZ
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-5225-5
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2010.5675075
  • Filename
    5675075