DocumentCode
1843116
Title
Feature selection using Sequential Forward Selection and classification applying Artificial Metaplasticity Neural Network
Author
Marcano-Cedeño, A. ; Quintanilla-Domínguez, J. ; Cortina-Januchs, M.G. ; Andina, D.
Author_Institution
Group for Autom. in Signals & Commun., Tech. Univ. of Madrid, Madrid, Spain
fYear
2010
fDate
7-10 Nov. 2010
Firstpage
2845
Lastpage
2850
Abstract
The feature selection has been widely used to reduce the data dimensionality. Data reduction improve the classification performance, the approximation function, and pattern recognition systems in terms of speed, accuracy and simplicity. A strategy to reduce the number of features in local search are the sequential search algorithms. In this work is presented a feature selection method based on Sequential Forward Selection (SFS) and Feed Forward Neural Network (FFNN) to estimate the prediction error as a selection criterion. Three well-known database have been used to test the SFS-FFNN with Artificial Metaplasticity on Perceptron Multilayer (AMMLP). The AMMLP is a new method applied for classification of patterns. The results obtained by SFS-FFNN with AMMLP in classification accuracy are superior than obtained by conventional BP algorithm and other recent feature selection algorithms applied to the same database. By these reasons the proposed method SFS-FFNN with AMMLP is an interesting alternative to reduce the data dimensionality and provide a high accuracy.
Keywords
data analysis; feature extraction; multilayer perceptrons; artificial metaplasticity neural network; artificial metaplasticity on perceptron multilayer; data dimensionality; data reduction; feed forward neural network; pattern recognition systems; sequential forward selection; Accuracy; Artificial neural networks; Databases; Iris; Iris recognition; Neurons; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
Conference_Location
Glendale, AZ
ISSN
1553-572X
Print_ISBN
978-1-4244-5225-5
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2010.5675075
Filename
5675075
Link To Document